

Denton Receives Patent for RF Ion Source
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Denton Vacuum was recently assigned patent number 10,573,495 B2 by the U.S. Patent Office for the Endeavor circular ion source. The Endeavor is a filament-free, self-neutralizing ion source that uses a single extraction grid. The Endeavor source is uniquely designed to improve thin film properties and create stress-free, high-density thin films for better performance. With… Read More